Join us for Week 2 of the NanoExchange Summer Series. Each session brings together graduate researchers to share work-in-progress, explore new ideas, and engage in open discussion across disciplines.
This summer’s NanoExchange is chaired by IMS Graduate Students Jack Loken and Jojo Pearson.
Date: Thursday, June 4, 2026
Coffee and Snacks: 10:00 to 10:30 AM
NanoExchange Sessions: 10:30 to 11:30 AM
Location: 202 Light Hall
Ben Schmidt | Tools and Capabilities in VINSE Core Facilities
VINSE core labs offer a variety of capabilities for fabrication and characterization of micro and nanoscale materials.Ìý This talk will benefit current and prospective users, providing an overview of the Cleanroom, Advanced Imaging Suite, and Analytical Lab, as well as how to get started as a user.Ìý Incoming tools, such as the Elionix 50kV ELS-BODEN EBL and Heidelberg Instruments uMLA laser writer, and new capabilities will be discussed, as well as research support services such as pilot funding, staff office hours, and photomask design.
Emmanuel Dabuo | Developing Scattering-Scanning Near Optical Microscopy (s-SNOM) and Nano-FTIR for Nanoscale Defect Characterization in Wide-Bandgap SemiconductorsÌý
As the desire for high power and more efficient electronic devices grows, the demand for wide-bandgap semiconductors intensifies. Silicon carbide (SiC) and gallium nitride (GaN), known for their superior breakdown voltage, high switching speeds, and excellent performance in high-frequency and high-temperatureÌýapplicationsÌýare the promising candidates. However, nanoscale defects, often undetectable by conventional metrology techniques, adversely affect the performance of these devices. This work explores the development of scattering-type scanning near-field optical microscopy (s-SNOM) and nanoscale Fourier transform infrared spectroscopy (nano-FTIR) as advanced, non-destructive tools for defect characterization in these materials. By combining high spatial resolution with optical and vibrational sensitivity, these techniques offer new pathways for understanding and mitigating these defects.Ìý